STANFORD CANCER IMAGING TRAINING (SCIT) PROGRAM
Program Directors: Sandy Napel, PhD and Bruce Daniel, MD
The Stanford Cancer Imaging Training (SCIT) Program, funded by the National Cancer Institute, aims to train the next generation of researchers in the development and clinical translation of advanced techniques for cancer imaging and its application.
This T32 training program is the evolution of the longstanding program, formerly known as “Advanced Techniques for Cancer Imaging and Detection,” established and led by former Radiology Chair, Dr. Gary M. Glazer in 1992.
SCIT is a two-year program training five fellows (roughly half PhD / half MD) per year over a five-year funding cycle. Drs. Sandy Napel and Bruce Daniel lead this newly redesigned program, featuring 24 mentors with independent cancer-focused or -related funding, and seven distinguished program advisors. The strengthened required coursework component includes two courses in the clinical/cancer sciences, two in imaging science, one in biostatistics, one in medical ethics (“Responsible Conduct of Research”), and attendance at a minimum of six multidisciplinary tumor boards. In addition, trainees can select from a multitude of electives offered by various Stanford University Departments, e.g., Radiology, Radiation Oncology, Bioengineering, Biomedical Informatics, and Cancer Systems Biology. The primary focus of the program is participation in a mentored cancer-imaging research project aimed at publication in peer-reviewed journals, and presentation at national meetings. The program especially features “paired mentorship,” in which each trainee is teamed with both a basic-science and physician mentor, to provide guidance in course and research-topic selection, and in performing clinically-relevant cancer imaging research.
1. Candidate must have an MD or PhD degree.
2. Candidate must be a US citizen, or a non-citizen national, or must have been lawfully admitted for permanent residence and possess an Alien Registration Card (1-151 or 1-551) or some other verification of legal admission as a permanent resident.
Application Deadline: April 10, 2017